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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

★★★★★4.9 out of 5(861 reviews)
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$16.65
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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, Pre-Owned in GOOD condition.  Book has several underlining and high-lighting.  May contain inscriptions on inside of front or back cover.Shipped with USPS Media Mail.

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📋 Product Description

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, 
Pre-Owned in GOOD condition.  Book has several underlining and high-lighting.  May contain inscriptions on inside of front or back cover.
Shipped with USPS Media Mail.

This product is superb for anyone looking for quality Outdoor products.

📐 Specifications

SKU: 165724

Category: Outdoor > Live Plants > Perennial Plants

Original Price:$16.65 USD

Sale Price:$9.99 USD

Availability: In Stock

Condition: Brand merely-arrived

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✓ on the house shipment on orders over $50

Standard transport: 3-5 business days

Express fulfillment: 1-2 business days (+$9.99)

30-Day Returns: Not satisfied? Return within 30 days for a full refund.

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Sarah Miller ✓ Verified Purchase
3 weeks ago · Omaha, NE
★★★★★
So glad I bought this
So far, it is straightforward to use and I’m satisfied.
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Ashley White ✓ Verified Purchase
6 months ago · Virginia Beach, VA
★★★★★
Exceptional quality
So far, it does the job and it’s fine overall.
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Lauren Nelson ✓ Verified Purchase
3 months ago · Austin, TX
★★★★☆
foremost purchase ever
In daily use, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, feels okay and I’m satisfied.
45 people found this helpful
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William Garcia ✓ Verified Purchase
6 months ago · Orlando, FL
★★★★★
Exceptional quality​
Personally, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, is uncomplicated to use and it meets expectations.
2 people found this helpful
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John Davidson ✓ Verified Purchase
5 months ago · Los Angeles, CA
★★★★★
really happy
In daily use, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, is practical which feels reasonable.
11 people found this helpful